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  2. Transmission Electron Microscopy
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  4. JEM-2011

JEM-2011

undefinedThis 200 kV transmission electron microscope is fitted with a LaB6 filament and has a lattice and point resolutions of 0.14 nm and 0.23 nm, respectively. Its magnification ranges from 100x to 1500,000x, and it is equipped with a scanning unit, PGT Energy Dispersive Spectroscopy (EDS) detector, a side entry AMT CCD camera. In addition to high resolution imaging capability, the equipment allows localized compositional and structural analyses of materials.

Typical analyses include:

  • Conventional diffraction contrast imaging
  • Electron Diffraction
  • High resolution transmission electron imaging
  • Nano scale compositional analysis with 10nm spatial resolution